Multistage Interconnection Network Reliability

TitleMultistage Interconnection Network Reliability
Publication TypeJournal Article
Year of Publication1989
AuthorsJT Blake, and KS Trivedi
JournalIEEE Transactions on Computers
Volume38
Issue11
Start Page1600
Pagination1600 - 1604
Date Published01/1989
Abstract

In this paper, we examine the reliability of an unique-path multistage interconnection network (MIN) and a faulttolerant scheme aimed at improving system reliability. We derive closed-form expressions for the time-dependent reliability of the 8×8 and 16 × 16 shuffle-exchange multistage interconnection networks (SEN's) and SEN's with an additional stage (SEN+). These expressions are derived without any assumptions regarding the underlying component-lifetime distributions. Furthermore, we derive a tight reliability lower bound that is useful for the analysis of larger networks. We provide numerical results for networks as large as 1024 x 1024. © 1989 IEEE

DOI10.1109/12.42134
Short TitleIEEE Transactions on Computers