Title | Multistage Interconnection Network Reliability |
Publication Type | Journal Article |
Year of Publication | 1989 |
Authors | JT Blake, and KS Trivedi |
Journal | IEEE Transactions on Computers |
Volume | 38 |
Issue | 11 |
Start Page | 1600 |
Pagination | 1600 - 1604 |
Date Published | 01/1989 |
Abstract | In this paper, we examine the reliability of an unique-path multistage interconnection network (MIN) and a faulttolerant scheme aimed at improving system reliability. We derive closed-form expressions for the time-dependent reliability of the 8×8 and 16 × 16 shuffle-exchange multistage interconnection networks (SEN's) and SEN's with an additional stage (SEN+). These expressions are derived without any assumptions regarding the underlying component-lifetime distributions. Furthermore, we derive a tight reliability lower bound that is useful for the analysis of larger networks. We provide numerical results for networks as large as 1024 x 1024. © 1989 IEEE |
DOI | 10.1109/12.42134 |
Short Title | IEEE Transactions on Computers |