RELIABILITY OF THE SHUFFLE-EXCHANGE NETWORK AND ITS VARIANTS.

TitleRELIABILITY OF THE SHUFFLE-EXCHANGE NETWORK AND ITS VARIANTS.
Publication TypeJournal Article
Year of Publication1988
AuthorsJT Blake, and KS Trivedi
JournalProceedings of the Hawaii International Conference on System Science
Start Page174
Pagination174 - 182
Date Published01/1988
Abstract

The authors consider the reliability of the shuffle-exchange multistage interconnection network (SEN) and two variations of this network aimed at improving reliability through fault tolerance. The two variations are the SEN with an extra stage and the redundant SEN. Exact closed-form expressions are derived for the time-dependent reliability of the 8 multiplied by 8 and 16 multiplied by 16 SEN and SEN with an extra stage (SEN plus ). A tight-reliability lower bound that is useful for the analysis of larger networks is derived. Numerical results are provided for networks as large as 1024 multiplied by 1024. A comparison of these networks shows that on the basis of reliability, the SEN plus is superior to the SEN and the redundant SEN.

DOI10.1109/hicss.1988.11763
Short TitleProceedings of the Hawaii International Conference on System Science