A review of the research on quantitative reliability prediction and assessment for electronic components

TitleA review of the research on quantitative reliability prediction and assessment for electronic components
Publication TypeJournal Article
Year of Publication2011
AuthorsY Zhao, X Yin, R Kang, and KS Trivedi
Journal2011 Prognostics and System Health Management Conference, PHM-Shenzhen 2011
Date Published08/2011
Abstract

A review is carried out on how quantitative approaches have been applied so far to the Reliability Prediction and Assessment (RPA) for computer and communication systems. A series of the reliability evaluation technology based on analytic models and computer simulations are developed for use in product design and test, shape, system operation and maintenance, during a research initiative towards understanding the quantitative characteristics of hardware and software systems. The implementation of these techniques guarantees that the sophisticated system satisfying the high standard on reliability, availability, performability, maintainability and safety. Such approaches conduct quantitative assessment for reliability at the system level. Such reliability quantitative assessments are effectively used in the system decision-making for fault detection, failures elimination, optimization, maintenance and safety. © 2011 IEEE.

DOI10.1109/PHM.2011.5939553
Short Title2011 Prognostics and System Health Management Conference, PHM-Shenzhen 2011