Title | A review of the research on quantitative reliability prediction and assessment for electronic components |
Publication Type | Journal Article |
Year of Publication | 2011 |
Authors | Y Zhao, X Yin, R Kang, and KS Trivedi |
Journal | 2011 Prognostics and System Health Management Conference, Phm Shenzhen 2011 |
Date Published | 08/2011 |
Abstract | A review is carried out on how quantitative approaches have been applied so far to the Reliability Prediction and Assessment (RPA) for computer and communication systems. A series of the reliability evaluation technology based on analytic models and computer simulations are developed for use in product design and test, shape, system operation and maintenance, during a research initiative towards understanding the quantitative characteristics of hardware and software systems. The implementation of these techniques guarantees that the sophisticated system satisfying the high standard on reliability, availability, performability, maintainability and safety. Such approaches conduct quantitative assessment for reliability at the system level. Such reliability quantitative assessments are effectively used in the system decision-making for fault detection, failures elimination, optimization, maintenance and safety. © 2011 IEEE. |
DOI | 10.1109/PHM.2011.5939553 |
Short Title | 2011 Prognostics and System Health Management Conference, Phm Shenzhen 2011 |